Semi-automatic measurement setup for noise characterization of CMOS transistors

This thesis work is concerned with the design of an automated system noise measurements in MOSFET transistors. In particular, the system is capable of setting the bias point of the device under test (DUT) according to the user requirements. The test of the DUT is performed by means of a specifically design board, biasing the DUT and amplifying the noise above the noise level of the electronic equipment used to carry out the measurement. A python script is used to control the instruments, acquire the measurement results and perform the calculations needed to extract the information about the DUT noise performance. The measurements carried out in this work, besides illustrating the noise characteristics of the CMOS technology under investigation, are used to explore its radiation tolerance by means of tests performed after exposing the DUTs to ionizing radiation. Using the same automated system, measurements were actually carried out after irradiation and formed before irradiation compared with measurements of post-irradiation.

Sistema semi automatico per misure di rumore in transistori CMOS